TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning. - Andrew Yi-Ann Huang; Katherine Shu-Min Li; Cheng-Yen Tsai; Ken Chau-Cheung Cheng; Sying-Jyan Wang; Xu-Hao Jiang; Leon Chou; Chen-Shiun Lee (ITC, 2019)

Semi-Supervised Framework for Wafer Defect Pattern Recognition with Enhanced Labeling. - Leon Li-Yang Chen; Katherine Shu-Min Li; Xu-Hao Jiang; Sying-Jyan Wang; Andrew Yi-Ann Huang; Jwu E. Chen; Hsing-Chung Liang; Chun-Lung Hsu (ITC, 2021)