Enhanced Diffusion-Based Analysis for Fast Defect Detection in ECPT Image. - Yiping Liang; Libing Bai; Lulu Tian; Xu Zhang 055; Chao Ren 008; Dan Shao; Zhenzhong Ma; Mosi Sun (IEEE Trans. Ind. Informatics, 2024)

Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction. - Xu Zhang 055; Libing Bai; Jie Zhang 086; Yiping Liang; Yuhua Cheng 001; Lulu Tian; Yong Duan (IEEE Trans. Ind. Informatics, 2024)

Surface Defect 3-D Profile Reconstruction Using Eddy Current Pulsed Thermography. - Xu Zhang 055; Libing Bai; Yiping Liang; Jinsheng Yang; Jiangshan Ai; Chao Ren 008 (IEEE Trans. Ind. Informatics, 2024)

Multidirectional Information Fusion for Complex Defect Reconstruction Based on Induced Current Thermo-Electrical Impedance Tomography. - Xu Zhang 055; Libing Bai; Lulu Tian; Jiangshan Ai; Yiping Liang; Jie Zhang 086; Quan Zhou 019 (IEEE Trans. Ind. Informatics, 2024)

Thermal Parameter Reconstruction Imaging for Interlayer Defect Detection in ECPT. - Yiping Liang; Libing Bai; Lulu Tian; Xu Zhang 055; Yong Gao (IEEE Trans. Ind. Informatics, 2025)