Characterisation of defects generated during constant current InGaN-on-silicon LED operation. - Riko I. Made; Yu Gao; Govindo J. Syaranamual; Wardhana A. Sasangka; L. Zhang; Xuan Sang Nguyen; Y. Y. Tay; Jason Scott Herrin; Carl V. Thompson; Chee Lip Gan (Microelectron. Reliab., 2017)