Total ionizing dose test facilities for micro-electronic circuits. - Haibin Wang; Rui Liu 011; Xuantian Li; Li Chen 001; David M. Hiemstra; Valeri Kirischian (CCECE, 2016)

An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology. - Qingyu Chen; Haibin Wang; Li Chen 001; Lixiang Li 001; Xing Zhao; Rui Liu 011; Mo Chen 008; Xuantian Li (J. Electron. Test., 2016)

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. - Shuting Shi; Rui Chen; Rui Liu 011; Mo Chen 008; Chen Shen; Xuantian Li; Haonan Tian; Li Chen 001 (J. Electron. Test., 2021)

Grain-YOLO: An improved lightweight YOLO v8 and its android deployment for rice grains detection. - Changjiang Liu; Lei Zhong; Jie Wang; Junming Huang 004; Yuwei Wang; Maoxue Guan; Xuantian Li; Huiwen Zheng; Xihong Hu; Xu Ma; Suiyan Tan (Comput. Electron. Agric., 2025)