GaN-based HEMTs tested under high temperature storage test. - Denis Marcon; Xuanwu Kang; John Viaene; Marleen Van Hove; Puneet Srivastava; Stefaan Decoutere; Robert Mertens 004; Gustaaf Borghs (Microelectron. Reliab., 2011)

High temperature behaviour of GaN-on-Si high power MISHEMT devices. - Dirk Wellekens; Rafael Venegas; Xuanwu Kang; Mohammed Zahid; Tian-Li Wu; Denis Marcon; Puneet Srivastava; Marleen Van Hove; Stefaan Decoutere (ESSDERC, 2012)

Reliability of AlGaN/GaN HEMTs: Permanent leakage current increase and output current drop. - Denis Marcon; John Viaene; Paola Favia; Hugo Bender; Xuanwu Kang; Silvia Lenci; Steve Stoffels; Stefaan Decoutere (Microelectron. Reliab., 2012)