TID-induced leakage-assisted degradation and failure mechanisms in cathode-short base-resistance-controlled thyristors. - Xuanyi Huo; Limei Song; Xiaowu Cai; Longli Pan; Jian Lu; Lei Shu; Bo Li 051 (Microelectron. J., 2026)

High-Speed Floating Voltage Level Shifter With Self-Locked Noise Immunity for High-Side Gate Driver. - Xupeng Wang; Xiaowu Cai; Yu Lu; Weidong Zhang; Xuanyi Huo; Longli Pan; Jian Lu; Liang Shan 015; Lei Wang; Bo Li 051 (IEEE Trans. Very Large Scale Integr. Syst., 2026)