Safety-Guided Test Generation for Structural Faults. - Xuanyi Tan; Dhruv Thapar; Deepesh Sahoo; Arjun Chaudhuri; Sanmitra Banerjee; Krishnendu Chakrabarty; Rubin A. Parekhji (ITC, 2024)

ML-TIME: ML-driven Timing Analysis of Integrated Circuits in the Presence of Process Variations and Aging Effects. - Xuanyi Tan; Peter Domanski; Sanmitra Banerjee; Krishnendu Chakrabarty (MLCAD, 2024)