Total-dose-induced edge effect in SOI NMOS transistors with different layouts. - Jie Liu; Jicheng Zhou; Hongwei Luo; Xuedong Kong; Yunfei En; Qian Shi; Yujuan He (Microelectron. Reliab., 2010)

Analysis and Estimate the Effect of Knowledge on Software Reliability Distribution. - Chunhui Yang; Yan Gao; Xuedong Kong; Dingfang Chen; Shengwu Xiong 001; Jianwen Xiang (HCC, 2017)