Identification of MOSFET Working State Based on the Stress Wave and Deep Learning. - Yun Bai; Songyuan Liu; Yunze He; Liang Cheng 005; Fei Liu; Xuefeng Geng (IEEE Trans. Instrum. Meas., 2022)

Investigation of the Influence of Temperature on Stress Waves at the Turn-Off Moment in IGBT. - Xuefeng Geng; Yunze He; Guangxin Wang; Longhai Tang; Qiying Li; Songyuan Liu (IEEE Trans. Instrum. Meas., 2023)

Mechanical Stress Wave Noncontact Laser Detection Method of Power Semiconductor Devices - Observation of Low-Frequency Signals. - Qiying Li; Yunze He; Mengchuan Li; Yang Ping; Longhai Tang; Xuefeng Geng; Guangxin Wang; Shan Chang; Jie Zhang (IEEE Trans. Instrum. Meas., 2024)