An approach of near infrared image accurate orientation and recognition. - Xuejuan Hu; Shuangchen Ruan; Chengxiang Liu (EMEIT, 2011)

Automatic detection of surface defects based on deep random chains. - Tan Zhang; Zihe Wang; Fengwei Li; Haoyang Zhong; Xuejuan Hu; Wenjun Zhang 005; Dan Zhang 006; Xiaoxu Liu (Expert Syst. Appl., 2023)