A scaleable model for STI mechanical stress effect on layout dependence of MOS electrical characteristics. - Ke-Wei Su; Yi-Ming Sheu; Chung-Kai Lin; Sheng-Jier Yang; Wen-Jya Liang; Xuemei Xi; Chung-Shi Chiang; Jaw-Kang Her; Yu-Tai Chia; Carlos H. Diaz; Chenming Hu (CICC, 2003)

Practical compact modeling approaches and options for sub-0.1 mum CMOS technologies. - Mansun Chan; Xuemei Xi; Jin He 003; Kanyu M. Cao; Mohan V. Dunga; Ali M. Niknejad; Ping K. Ko; Chenming Hu (Microelectron. Reliab., 2003)

The next generation BSIM for sub-100nm mixed-signal circuit simulation. - Xuemei Xi; Jin He 003; Mohan V. Dunga; Chung-Hsun Lin; Babak Heydari; Hui Wan 003; Mansun Chan; Ali M. Niknejad; Chenming Hu (CICC, 2004)

A Non-Charge-Sheet Based Analytical Model of Undoped Symmetric Double-Gate MOSFETs Using SPP Approach. - Jin He 003; Xuemei Xi; Mansun Chan; Chung-Hsun Lin; Ali M. Niknejad; Chenming Hu (ISQED, 2004)