Research on the Tolerance Distribution of Sealed Electromagnetic Relay with Reliability Index. - Huimin Liang; Xuerong Ye; Guofu Zhai (IEICE Trans. Electron., 2006)

Research on Dynamic Characteristics Testing and Analyzing System of Electromagnetic Relay. - Xuerong Ye; Huimin Liang; Jie Deng; Guofu Zhai (IEICE Trans. Electron., 2009)

Failure Process and Dynamic Reliability Estimation of Sealed Relay. - Xuerong Ye; Jie Deng; Qiong Yu; Guofu Zhai (IEICE Trans. Electron., 2011)

A Tolerance Design Method for Electronic Circuits Based on Performance Degradation. - Guofu Zhai; Yuege Zhou; Xuerong Ye (Qual. Reliab. Eng. Int., 2015)

A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests. - Xuerong Ye; Cen Chen 003; Myeongsu Kang; Guofu Zhai; Michael G. Pecht (IEEE Access, 2018)

Lifetime prediction of aluminum electrolytic capacitors in LED drivers considering parameter shifts. - Hao Niu 002; Shujuan Wang; Xuerong Ye; Huai Wang; Frede Blaabjerg (Microelectron. Reliab., 2018)

VDMOSFET HEF degradation modelling considering turn-around phenomenon. - Xuerong Ye; Cen Chen 003; Yixing Wang; L. Wang; Guofu Zhai (Microelectron. Reliab., 2018)

Fault localization of a switched mode power supply based on extended integer-coded dictionary method. - Xuerong Ye; Cen Chen 003; Guofu Zhai (Microelectron. Reliab., 2018)

Manufacturing process-based storage degradation modelling and reliability assessment. - Xuerong Ye; Yigang Lin; Qingmin Wang; Hao Niu 002; Guofu Zhai (Microelectron. Reliab., 2018)

The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress. - Xuerong Ye; Kaixin Zhang; Cen Chen 003; Zhongwei Li; Yue Wang; Guofu Zhai (Microelectron. Reliab., 2018)

An Improved Empirical Mode Decomposition Based on Adaptive Weighted Rational Quartic Spline for Rolling Bearing Fault Diagnosis. - Xuerong Ye; Yifan Hu; Junxian Shen; Rui Feng; Guofu Zhai (IEEE Access, 2020)

An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation. - Yun Yang; Cen Chen 003; Xuerong Ye; Chengzhi Sun (I2MTC, 2021)

Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary. - Cen Chen 003; Yun Yang; Xuerong Ye; Guofu Zhai (IEEE Access, 2021)

A failure mechanism consistency test method for accelerated degradation test. - Guofu Zhai; Bokai Zheng; Xuerong Ye; Shuang Si; Enrico Zio (Qual. Reliab. Eng. Int., 2021)

Life-Cycle Dynamic Robust Design Optimization for Batch Production of Permanent Magnet Actuator. - Xuerong Ye; Hao Chen 086; Cen Chen 003; Guofu Zhai (IEEE Trans. Ind. Electron., 2021)

An Adaptive Optimized TVF-EMD Based on a Sparsity-Impact Measure Index for Bearing Incipient Fault Diagnosis. - Xuerong Ye; Yifan Hu; Junxian Shen; Cen Chen 003; Guofu Zhai (IEEE Trans. Instrum. Meas., 2021)

A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling. - Xuerong Ye; Yifan Hu; Bokai Zheng; Cen Chen 003; Guofu Zhai (Reliab. Eng. Syst. Saf., 2022)

Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process. - Bokai Zheng; Cen Chen 003; Yigang Lin; Yifan Hu; Xuerong Ye; Guofu Zhai; Enrico Zio (Reliab. Eng. Syst. Saf., 2022)

Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate. - Bokai Zheng; Cen Chen 003; Yigang Lin; Xuerong Ye; Guofu Zhai (IEEE Trans. Reliab., 2023)

Model-based quality consistency analysis of permanent magnet synchronous motor cogging torque in wide temperature range. - Cen Chen 003; Chengzhi Sun; Liqin Wu; Xuerong Ye; Guofu Zhai (Qual. Reliab. Eng. Int., 2023)

Life prediction of lithium thionyl chloride batteries based on the pulse load test and accelerated degradation test. - Xuerong Ye; Qisen Sun; Wenwen Li; Guofu Zhai (Qual. Reliab. Eng. Int., 2023)

Cumulative Degradation Modeling of Electrolytic Capacitors Considering Stress Interactions in Industrial Applications. - Qisen Sun; Cen Chen 003; Zicheng Wang; Xuerong Ye; Min Xie 001; Guofu Zhai (IEEE Trans. Ind. Electron., 2025)