An intelligent stock trading decision support system through integration of genetic algorithm based fuzzy neural network and artificial neural network. - Ren Jie Kuo; C. H. Chen; Y. C. Hwang (Fuzzy Sets Syst., 2001)

Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology. - Nam-Hyun Lee; Sunhang Lee; S.-H. Kim; G.-J. Kim; K. W. Lee; Y. S. Lee; Y. C. Hwang; H. S. Kim; S. Pae (IRPS, 2022)

Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC. - S. Lee; N.-H. Lee; K. W. Lee; J. H. Kim; J. H. Jin; Y. S. Lee; Y. C. Hwang; H. S. Kim; S. Pae (IRPS, 2023)

Thermo-Mechanical Reliability Characteristics of 8H HBM3. - Jinsoo Bae; H. G. Noh; S. J. Yoo; I. J. Choi; G. H. Bae; Y. M. Shim; S. G. Lee; H. Jang; S. M. Lee; G. H. Chang; K. S. Kwon; C. B. Yoon; et al. (IRPS, 2024)

A Critical Investigation of Hot Carrier Degradation in Low VTNMOSFETs in DRAM. - N. Choudhury; S. Lee; D. Son; G. Yang; G.-J. Kim; N.-H. Lee; Y. C. Hwang; SB. Ko; S. Pae (IRPS, 2025)