Analysis of a sequence of images using point and line correspondences. - Jake K. Aggarwal; Y. F. Wang (ICRA, 1987)

A new method for computing intrinsic surface properties. - Y. F. Wang; P. Liang (CVPR, 1989)

Vertical deposition of nanospheres on the open sidewalls of silicon pillars. - Y. F. Wang; Y. Tian; K. J. Feng; C. Li; D. D. She; W. G. Wu (NEMS, 2012)

Comprehensive device and product level reliability studies on advanced CMOS technologies featuring 7nm high-k metal gate FinFET transistors. - D. S. Huang; J. H. Lee; Y. S. Tsai; Y. F. Wang; Y. S. Huang; C. K. Lin; Ryan Lu; Jun He (IRPS, 2018)

Fast Algorithms for Fourier extension based on boundary interval data. - Z. Y. Zhao; Y. F. Wang; Anatoly Yagola (CoRR, 2024)