Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area. - Y. Joly; L. Truphemus; Laurent Lopez; Jean-Michel Portal; Hassen Aziza; Franck Julien; Pascal Fornara (ISCAS, 2011)

Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress. - Y. Joly; Laurent Lopez; Jean-Michel Portal; Hassen Aziza; Jean-Luc Ogier; Y. Bert; Franck Julien; Pascal Fornara (Microelectron. Reliab., 2011)