Failure Mechanism and Unified Endurance Model of Embedded MRAM Towards Cache Application. - Y. H. Chen; Yu-Sheng Chen; Yi Ching Ong; Y. L. Chu; Kuo-Feng Huang; Yuan-Jen Lee; C. Y. Wang; C. Y. Wu; W. H. Chuang; Allen Y. J. Wang; K. C. Huang; Harry Chuang (IRPS, 2025)