A shock model with two-type failures and optimal replacement policy. - G. J. Wang; Y. L. Zhang (Int. J. Syst. Sci., 2005)

Reliability study of underfill/chip interface under accelerated temperature cycling (ATC) loading. - Y. L. Zhang; D. X. Q. Shi; Wei Zhou (Microelectron. Reliab., 2006)

The Hemivariational Inequalities for an Upper Semicontinuous Set-valued Mapping. - Y. L. Zhang; Y. R. He (J. Optim. Theory Appl., 2013)

Classification of ADHD Individuals and Neurotypicals Using Reliable RELIEF: A Resting-State Study. - Bo Miao; L. L. Zhang; J. L. Guan; Q. F. Meng; Y. L. Zhang (IEEE Access, 2019)