A distributed Smalltalk based on process-object model. - Y. S. Lee; J. H. Huang; Feng-Jian Wang (COMPSAC, 1991)

Object Movement in Distributed Object-Oriented Systems. - Y. S. Lee; Feng-Jian Wang; C. H. Chang (Inf. Sci., 1994)

An integrated H.263 video CODEC with protocol processor. - K. A. Jung; Y. S. Lee; H. S. Yang; W. S. Yang; JooHyoung Kim; Seung-Ho Lee; B. H. Kang (ISCAS (5), 2001)

General receding horizon control for linear time-delay systems. - Wook Hyun Kwon; Y. S. Lee; Soo Hee Han (Autom., 2004)

Bounded PSO Vmax Function in Neural Network Learning. - Y. S. Lee; Siti Mariyam Hj. Shamsuddin; Haza Nuzly Abdull Hamed (ISDA (1), 2008)

Two Fusion Predictors for Multisensor Discretetime Linear System. - Ha Ryong Song; Moongu Jeon; Y. S. Lee; Tae-Sun Choi; Vladimir Shin (Int. J. Robotics Autom., 2009)

Application of Particle Swarm Optimization to Solve Configuration Change Problems. - Z. H. Che 001; H. S. Wang; P. C. Huang; P. C. Chang; Y. S. Lee (IIAI-AAI, 2018)

Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology. - Nam-Hyun Lee; Sunhang Lee; S.-H. Kim; G.-J. Kim; K. W. Lee; Y. S. Lee; Y. C. Hwang; H. S. Kim; S. Pae (IRPS, 2022)

Reliability Characterization of HBM featuring $ text{HK}+ text{MG}$ Logic Chip with Multi-stacked DRAMs. - Sungmock Ha; S. Lee; G. H. Bae; D. S. Lee; S. H. Kim; B. W. Woo; N.-H. Lee; Y. S. Lee; S. Pae (IRPS, 2023)

Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC. - S. Lee; N.-H. Lee; K. W. Lee; J. H. Kim; J. H. Jin; Y. S. Lee; Y. C. Hwang; H. S. Kim; S. Pae (IRPS, 2023)

Reliability Improvement with Optimized BEOL Process in Advanced DRAM. - J. H. Lee; B. W. Woo; Y. M. Lee; N. H. Lee; S. H. Lee; Y. S. Lee; H. S. Kim; S. Pae (IRPS, 2023)