Charging-Effects in RF capacitive switches influence of insulating layers composition. - Mohamed Lamhamdi; Jean Guastavino; Laurent Boudou; Y. Segui; Patrick Pons; Laurent Bouscayrol; Robert Plana (Microelectron. Reliab., 2006)

Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches. - A. Belarni; Mohamed Lamhamdi; Patrick Pons; Laurent Boudou; Jean Guastavino; Y. Segui; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. - Mohamed Lamhamdi; Patrick Pons; Usama Zaghloul; Laurent Boudou; Fabio Coccetti; Jean Guastavino; Y. Segui; George J. Papaioannou; Robert Plana (Microelectron. Reliab., 2008)