Defect prediction for reactive ion etching using neural networks. - D. Stokes; Gary May; V. Chen; Y. T. Lin (ICNN, 1997)

Systematic defect screening in controlled experiments using volume diagnosis. - B. Seshadri; P. Gupta; Y. T. Lin; Bruce Cory (ITC, 2012)

Spin wave nanofabric update. - J. G. Alzate; Parag Upadhyaya; M. Lewis; J. Nath; Y. T. Lin; Kin Wong; S. Cherepov; P. Khalili Amiri; Kang L. Wang; J. Hockel; A. Bur; Gregory P. Carman; et al. (NANOARCH, 2012)

Day-Ahead PV Output Forecast Using Bayesian Optimized Long Short-Term Memory Network. - W. Y. Huang; Y. T. Lin; E. J. Lin; G. Y. Li; G. W. Chang (IAS, 2025)