Heavy-ion irradiation study in SOI-based and bulk-based junctionless FinFETs using 3D-TCAD simulation. - N. Vinodhkumar; Y. V. Bhuvaneshwari; K. K. Nagarajan; R. Srinivasan (Microelectron. Reliab., 2015)

Extraction and Analysis of Mobility in Double Gate Junctionless Transistor. - Y. V. Bhuvaneshwari; Abhinav Kranti (VLSID, 2017)