General linearized model use for High Power Reliability Assessment test results: Conditions, procedure and case study. - Corinne Bergès; Y. Weber; Pierre Soufflet (Microelectron. Reliab., 2015)

In-depth investigation of metallization aging in power MOSFETs. - R. Ruffilli; Mounira Berkani; Philippe Dupuy; Stéphane Lefebvre; Y. Weber; Marc Legros (Microelectron. Reliab., 2015)

Mechanisms of power module source metal degradation during electro-thermal aging. - R. Ruffilli; Mounira Berkani; Philippe Dupuy; Stéphane Lefebvre; Y. Weber; Marc Legros (Microelectron. Reliab., 2017)