An object-oriented assembly modeling approach. - Y. Yue; O. W. Salomons; H. J. J. Kals; F. J. A. M. van Houten (APMS, 1999)

A review of recent MOSFET threshold voltage extraction methods. - Adelmo Ortiz-Conde; Francisco J. García-Sánchez; Juin J. Liou; Antonio Cerdeira; Magali Estrada; Y. Yue (Microelectron. Reliab., 2002)

Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors. - Hei Wong; Y. Fu; Juin J. Liou; Y. Yue (Microelectron. Reliab., 2009)

Capturing the Symmetry of attractors and the Transition to Symmetric Chaos in a vibro-Impact System. - Y. Yue; J. H. Xie; X. J. Gao (Int. J. Bifurc. Chaos, 2012)