Reliability Testing by Precise Electrical Measurement. - A. P. Dorey; B. K. Jones; Andrew Mark David Richardson; P. C. Russell; Y. Z. Xu (ITC, 1988)

Leakage Increase of Narrow and Short BCPMOS. - Y. Z. Xu; O. Pohland; C. Cai; Helmut Puchner (ISQED, 2004)

A novel double RESURF LDMOS for HVIC's. - S. Hardikar; Merlyne M. De Souza; Y. Z. Xu; T. J. Pease; E. M. Sankara Narayanan (Microelectron. J., 2004)