An all-digital built-in-self-test scheme for duty cycle corrector with de-skew circuit in NAND Flash memory. - Ya Hai; Fei Liu; Yongshan Wang; Jing Kang (Microelectron. J., 2023)

A wide-frequency all-digital duty cycle corrector with self-adaptive configurable delay chain. - Ya Hai; Fei Liu; Yongshan Wang (IEICE Electron. Express, 2024)

A wide-frequency and high-precision ZQ calibration circuit for NAND Flash memory. - Ya Hai; Fei Liu; Yongshan Wang; Liyin Fu; Jian Huo (Microelectron. J., 2024)