Statistical Inference of Accelerated Life Testing With Dependent Competing Failures Based on Copula Theory. - Xiang Po Zhang; Jianzhong Shang; Xun Chen; Chunhua Zhang 005; Ya Shun Wang (IEEE Trans. Reliab., 2014)

Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing. - Chunhua Zhang 005; Xiang Lu; Yuan-yuan Tan; Ya Shun Wang (Reliab. Eng. Syst. Saf., 2015)

Optimal Design of Step-stress Accelerated Degradation Test with Multiple Stresses and Multiple Degradation Measures. - Ya Shun Wang; Xun Chen; Yuan-yuan Tan (Qual. Reliab. Eng. Int., 2017)