Damage Model Test of Prestressed T-Beam Under Explosion Load. - Guozhen Han; Yan Bo; Yang Zan (IEEE Access, 2019)

Dual Lumped Ports Technique and Its Applications in Modeling of Planar Schottky Diode in THz Band. - Chengkai Wu; Yong Zhang 039; Yuehang Xu; Yan Bo; Ruimin Xu (IEEE Access, 2020)

RLSA-PFL: Robust Lightweight Secure Aggregation with Model Inconsistency Detection in Privacy-Preserving Federated Learning. - Nazatul H. Sultan; Yan Bo; Yansong Gao 001; Seyit Camtepe; Arash Mahboubi; Hang Thanh Bui; Aufeef Chauhan; Hamed Aboutorab; Michael Bewong; Praveen Gauravaram; Md. Rafiqul Islam 001; Sharif Abuadbba (CoRR, 2025)