From IC Layout to Die Photo: A CNN-Based Data-Driven Approach. - Hao-Chiang Shao; Chao-Yi Peng; Jun-Rei Wu; Chia-Wen Lin; Shao-Yun Fang; Pin-Yen Tsai; Yan-Hsiu Liu (CoRR, 2020)

Cluster Tool Performance Analysis using Graph Database. - Shiuan-Hau Huang; Hsin-Ping Yen; Yan-Hsiu Liu; Kuang-Hsien Tseng; Ji-Fu Kung; Chia-Chun Lin; Yi-Ting Li; Yung-Chih Chen; Chun-Yao Wang (SoCC, 2021)

From IC Layout to Die Photograph: A CNN-Based Data-Driven Approach. - Hao-Chiang Shao; Chao-Yi Peng; Jun-Rei Wu; Chia-Wen Lin; Shao-Yun Fang; Pin-Yen Tsai; Yan-Hsiu Liu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)

A Flexible Cluster Tool Simulation Framework with Wafer Batch Dispatching Time Recommendation. - Hsin-Ping Yen; Shiuan-Hau Huang; Yan-Hsiu Liu; Kuang-Hsien Tseng; Ji-Fu Kung; Yi-Ting Li; Yung-Chih Chen; Chun-Yao Wang (ISQED, 2023)

Keeping Deep Lithography Simulators Updated: Global-Local Shape-Based Novelty Detection and Active Learning. - Hao-Chiang Shao; Hsing-Lei Ping; Kuo-Shiuan Chen; Weng-Tai Su; Chia-Wen Lin; Shao-Yun Fang; Pin-Yian Tsai; Yan-Hsiu Liu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

LithoHoD: A Litho Simulator-Powered Framework for IC Layout Hotspot Detection. - Hao-Chiang Shao; Guan-Yu Chen; Yu-Hsien Lin; Chia-Wen Lin; Shao-Yun Fang; Pin-Yian Tsai; Yan-Hsiu Liu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)