Standard measuring device for thickness of silicon wafer based on laser compensation system. - Yan-hua Zeng; Yun-xia Fu; Dong-mei Tang; Yi-qing Zhu (ICSAI, 2017)

Calibration Device for Test Sieves Based on Image Measuring Instrument. - Dong-mei Tang; Yan-hua Zeng; Yun-xia Fu; Bo Zhang (ICSAI, 2018)