Exploration of LLM Workload Reliability Based on di/dt Effects and Voltage Droops. - Zhixing Jiang; Justin Garrigus; Allison Seigler; Ethan Syed; Yan-Lun Huang; Mehdi Sadi; Tawfik Rahal-Arabi; Lizy Kurian John (HPCA, 2026)