Sidewall defects of AlGaN/GaN HEMTs evaluated by low frequency noise analysis. - Hsien-Chin Chiu; Chao-Hung Chen; Hsuan-Ling Kao; Feng-Tso Chien; Ping-Kuo Weng; Yan-Tang Gau; Hao-Wei Chuang (Microelectron. Reliab., 2013)

Low gate interface traps AlGaN/GaN HEMTs using a lattice matched ZrZnO transparent gate design. - Hsien-Chin Chiu; Hsiang-Chun Wang; Chao-Wei Lin; Yi-Cheng Luo; Hsuan-Ling Kao; Feng-Tso Chien; Ping-Kuo Weng; Yan-Tang Gau; Hao-Wei Chuang (Microelectron. Reliab., 2013)