Iterative programming analysis of dopant-segregated multibit/cell Schottky barrier charge-trapping memories. - Yu-Hsuan Chen; Jr-Jie Tsai; Yan-Xiang Luo; Chun-Hsing Shih (NVMTS, 2015)

Reliability impacts of high-speed 3-bit/cell Schottky barrier nanowire charge-trapping memories. - Wei Chang; Chun-Hsing Shih; Yan-Xiang Luo; Wen-Fa Wu; Chen-Hsin Lien (Microelectron. Reliab., 2015)