A Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch. - Zhengfeng Huang; Lanxi Duan; Yan Zhang 197; Tianming Ni; Aibin Yan (IEEE Trans. Aerosp. Electron. Syst., 2023)

Designs of High-Speed Triple-Node-Upset Hardened Latch Based on Dual-Modular-Redundancy. - Zhengfeng Huang; Yan Zhang 197; Lei Ai; Huaguo Liang; Tianming Ni; Tai Song; Aibin Yan (J. Circuits Syst. Comput., 2024)