Accelerated life test of high power white light emitting diodes based on package failure mechanisms. - Sung-Il Chan; W. S. Hong; K. T. Kim; Yang Gi Yoon; J. H. Han; Joong Soon Jang (Microelectron. Reliab., 2011)

Conclusion of the accelerated stress conditions affecting phosphor-converted LEDs using the fractional factorial design method. - Yang Gi Yoon; J. H. Kang; I. H. Jang; S. I. Chan; Joong Soon Jang (Microelectron. Reliab., 2013)

Life time comparison of LED package and the self-ballasted LED lamps by simple linear regression analysis. - Yang Gi Yoon; Jae Phil Hyung; Ui Hyo Jeong; H. W. Lim; J. S. Jang (Microelectron. Reliab., 2015)

Charging-discharging characteristics of a wound aluminum polymer capacitor. - Ui Hyo Jeong; Jae Phil Hyung; Yang Gi Yoon; Min Ji Ko; Seok Geun Ha; Dong Hyuk Lee; Hong Woo Lim; Jang Joong Jang (Microelectron. Reliab., 2016)