Trapping Behaviors in CNTFETs: Measurement and Analysis of Time Constant, Energy Level, and Trap Location Based on Transient Drain Current. - Shijie Pan; Hui Zhu; Shiwei Feng 001; Yang Yang 175; Chao Xu; Shuai Huo; Xiaozhuang Lu; Yamin Zhang; Kun Bai (IEEE Trans. Instrum. Meas., 2025)