Yang Yu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023

2022

A Statistical Feature-Based Anomaly Detection Method for PFC Using Canonical Correlation Analysis.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2022

ESR Estimation for Aluminum Electrolytic Capacitor of Power Electronic Converter Based on Compressed Sensing and Wavelet Transform.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Electron., 2022

The Detection of Open and Leakage Faults for Prebond TSV Test Based on Weak Current Source.

[BibT_eX]

[DOI]

Kangkang Xu

Xu Fang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2021

TSV Fault Modeling and A BIST Solution for TSV Pre-bond Test.

[BibT_eX]

[DOI]

Kangkang Xu

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

An Online Noninvasive Estimation Method of Electrolytic Capacitor for Boost Converters.

[BibT_eX]

[DOI]

Proceedings of the IECON 2021, 2021

MIV Fault Modeling Method Based on Finite Element Analysis.

[BibT_eX]

[DOI]

Ziwen Xiao

Proceedings of the 2021 IEEE International Conference on Integrated Circuits, 2021

2020

A Post-Bond TSV Test Method Based on RGC Parameters Measurement.

[BibT_eX]

[DOI]

Xu Fang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

An Adaptive Carrier and Symbol Synchronization Approach for QPSK Signal.

[BibT_eX]

[DOI]

Proceedings of the 16th International Wireless Communications and Mobile Computing Conference, 2020

2019

TSV Prebond Test Method Based on Switched Capacitors.

[BibT_eX]

[DOI]

Xu Fang

IEEE Trans. Very Large Scale Integr. Syst., 2019

A Post-Bond TSVs Test Solution for Leakage Fault.

[BibT_eX]

[DOI]

Kangkang Xu

Proceedings of the IEEE International Test Conference in Asia, 2019

2018

NBTI and Power Reduction Using a Workload-Aware Supply Voltage Assignment Approach.

[BibT_eX]

[DOI]

J. Electron. Test., 2018

Multi-Frequency Test Generation for Incipient Faults in Analog Circuits Based on the Aliasing Measuring Model.

[BibT_eX]

[DOI]

Yueming Jiang

IEEE Access, 2018

TSV-Defect Modeling, Detection and Diagnosis Based on 3-D Full Wave Simulation and Parametric Measurement.

[BibT_eX]

[DOI]

IEEE Access, 2018

Workload-aware failure prediction method for VLSI devices using an LUT based approach.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

2017

NBTI and Leakage Reduction Using an Integer Linear Programming Approach.

[BibT_eX]

[DOI]

J. Circuits Syst. Comput., 2017

NBTI and Power Reduction Using an Input Vector Control and Supply Voltage Assignment Method.

[BibT_eX]

[DOI]

Algorithms, 2017

2016

NBTI-aware adaptive minimum leakage vector selection using a linear programming approach.

[BibT_eX]

[DOI]

Integr., 2016

NBTI-Aware Transient Fault Rate Analysis Method for Logic Circuit Based on Probability Voltage Transfer Characteristics.

[BibT_eX]

[DOI]

Algorithms, 2016

2013

Efficient concurrent BIST with comparator-based response analyzer.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013

Electronic circuit fault diagnosis methods based on improved Support Vector Machines.

[BibT_eX]

[DOI]

Gang Wang

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013

2012

Breast Tissue Image Classification Based on Semi-supervised Locality Discriminant Projection with Kernels.

[BibT_eX]

[DOI]

J. Medical Syst., 2012

2011

Multiscan-based Test Data Compression Using UBI Dictionary and Bitmask.

[BibT_eX]

[DOI]