A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. - Junghyun Nam; Sunghoon Chun; Gibum Koo; Yanggi Kim; Byungsoo Moon; Jonghyoung Lim; Jaehoon Joo; Sangseok Kang; Hoonjung Kim; Kyeongseon Shin; Kisang Kang; Sungho Kang (ITC, 2008)

Exploring research trends and hotspots in AI and art integration: ROST text mining analysis of China and South Korea. - Hailong Yuan; Yanggi Kim; Jiaxu Zhang; Lanli Li (J. Comput. Methods Sci. Eng., 2025)