Two sides of pulse quenching effect on the single-event transient pulse width at circuit-level. - Bin Liang; Yankang Du (ASICON, 2013)

Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells. - Yankang Du; Shuming Chen; Biwei Liu (Microelectron. J., 2013)

Mitigating the SERs of large combinational circuits by using half guard band technique in CMOS bulk technology. - Bin Liang; Yankang Du; Hui Xu (IEICE Electron. Express, 2014)

Different Mechanisms of Temperature Dependency of N-Hit SET in Bulk and PD-SOI Technology. - Biwei Liu; Yankang Du; Kai Zhang (IEICE Trans. Electron., 2014)

Flip-flops soft error rate evaluation approach considering internal single-event transient. - Ruiqiang Song; Shuming Chen; Yibai He; Yankang Du (Sci. China Inf. Sci., 2015)

A DMR logic for mitigating the SET induced soft errors in combinational circuits. - Jiajin Zhang; Yang Housen; Yankang Du; Gao Quan; Peng Lin; Zhang Yue; Lichang Chen (IEICE Electron. Express, 2016)

A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology. - Yankang Du; Shuming Chen (IEEE Trans. Reliab., 2016)

Software-Defined FPGA-Based Accelerator for Deep Convolutional Neural Networks: (Abstract Only). - Yankang Du; Qinrang Liu; Shuai Wei; Chen Gao (FPGA, 2018)

DIN: A Bio-Inspired Distributed Intelligence Networking. - Yufeng Li 002; Yankang Du; Chenhong Cao; Han Qiu 004 (NPC, 2019)

A Novel Software-Defined Convolutional Neural Networks Accelerator. - Yufeng Li 002; Yankang Du (IEEE Access, 2019)