Failure analysis on 14 nm FinFET devices with ESD CDM failure. - Shaalini Chithambaram; Pik Kee Tan; Yuzhe Zhao; Binghai Liu; Yinzhe Ma; Alfred Quah; Dayanand Nagalingam; Yanlin Pan; Zhihong Mai (Microelectron. Reliab., 2018)

Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique. - Pik Kee Tan; Yuzhe Zhao; Francis Rivai; Binghai Liu; Yanlin Pan; Ran He; Hao Tan; Zhihong Mai (Microelectron. Reliab., 2018)

Smoke video Detection based on double spectrum. - Changlin Song; Chuanfu Liu; Tingping Feng; Junmin Li; Yanlin Pan; Simon X. Yang (Int. J. Robotics Autom., 2024)