A 40nm CMOS 260kb SRAM-bitcell on-chip failure monitoring test scribe with integer-to-current converter. - Brice Lhomme; Yann Carminati; Bertrand Borot; Olivier Callen; Thierry Burdeau; Sylvain Clerc (ESSCIRC, 2010)

RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs. - Joseph Nguyen; David Turgis; David Bonciani; Brice Lhomme; Yann Carminati; Olivier Callen; Guillaume Guirleo; Lorenzo Ciampolini; Gérard Ghibaudo (NATW, 2016)