Characterization of 3D surface topography in 5-axis milling - Yann Quinsat; Sylvain Lavernhe; Claire Lartigue (CoRR, 2011)

Nonrigid Registration for Form Defect Identification of Thin Parts. - François Thiebaut; S. Bendjebla; Yann Quinsat; Claire Lartigue (J. Comput. Inf. Sci. Eng., 2018)

L-PBF AM process failures causal chain: an FMEA-based monitoring approach for process control. - Nicolas Muller; Yann Quinsat; Christophe Tournier (Int. J. Prod. Res., 2024)

Modal approach based on global stereocorrelation for defects measurement in wire-laser additive manufacturing. - Khalil Hachem; Yann Quinsat; Christophe Tournier; Nicolas Beraud (J. Electronic Imaging, 2024)