Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N. - Yannick Guhel; Bertrand Boudart; E. Delos; Marianne Germain; Z. Bougrioua (Microelectron. Reliab., 2006)

Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy. - Fanny Berthet; Yannick Guhel; Hamid Gualous; Bertrand Boudart; Jean-Lionel Trolet; Marc Piccione; Christophe Gaquière (Microelectron. Reliab., 2011)

Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence. - Fanny Berthet; Yannick Guhel; Hamid Gualous; Bertrand Boudart; Jean-Lionel Trolet; Marc Piccione; Christophe Gaquière (Microelectron. Reliab., 2012)

Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs. - Sébastien Petitdidier; Fanny Berthet; Yannick Guhel; Jean-Lionel Trolet; Philippe Mary; Christophe Gaquière; Bertrand Boudart (Microelectron. Reliab., 2015)