On the volatility of oxide defects: Activation, deactivation, and transformation. - Tibor Grasser; M. Wahl; Wolfgang Goes; Yannick Wimmer; Al-Moatasem El-Sayed; Alexander L. Shluger; Ben Kaczer (IRPS, 2015)

Origins and implications of increased channel hot carrier variability in nFinFETs. - Ben Kaczer; Jacopo Franco; M. Cho; Tibor Grasser; Philippe J. Roussel; Stanislav Tyaginov; M. Bina; Yannick Wimmer; Luis-Miguel Procel; Lionel Trojman; Felice Crupi; Gregory Pitner; et al. (IRPS, 2015)

Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs. - Prateek Sharma; Stanislav Tyaginov; Yannick Wimmer; Florian Rudolf; Karl Rupp; Hubert Enichlmair; J. H. Park; Hajdin Ceric; Tibor Grasser (Microelectron. Reliab., 2015)

Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence. - Wolfgang Goes; Yannick Wimmer; Al-Moatasem El-Sayed; Gerhard Rzepa; Markus Jech; Alexander L. Shluger; Tibor Grasser (Microelectron. Reliab., 2018)

Techno-economic assessment of waste heat recovery for green hydrogen production: a simulation study. - Natalie Frassl; Nina Ranjbar Sistani; Yannick Wimmer; Judith Kapeller; Klara Maggauer; Johannes Kathan (Elektrotech. Informationstechnik, 2024)