Yao Wang

Orcid: 0009-0005-3652-0424

Affiliations:
  • National University of Defense Technology, Changsha, China
  • Delft University of Technology, The Netherlands (former)


According to our database1, Yao Wang authored at least 15 papers between 2011 and 2023.

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Timeline

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Bibliography

2023
Back to Homogeneous Computing: A Tightly-Coupled Neuromorphic Processor With Neuromorphic ISA.
IEEE Trans. Parallel Distributed Syst., November, 2023

A General Layout Pattern Clustering Using Geometric Matching-based Clip Relocation and Lower-bound Aided Optimization.
ACM Trans. Design Autom. Electr. Syst., November, 2023

A Soft-Error Mitigation Approach Using Pulse Quenching Enhancement at Detailed Placement for Combinational Circuits.
ACM Trans. Design Autom. Electr. Syst., July, 2023

2022
Accurate timing prediction at placement stage with look-ahead RC network.
Proceedings of the DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10, 2022

2020
Lithography Hotspot Detection with FFT-based Feature Extraction and Imbalanced Learning Rate.
ACM Trans. Design Autom. Electr. Syst., 2020

Maximum Clique Based Method for Optimal Solution of Pattern Classification.
Proceedings of the 38th IEEE International Conference on Computer Design, 2020

2017
A Mixed-Size Monolithic 3D Placer with 2D Layout Inheritance.
Proceedings of the on Great Lakes Symposium on VLSI 2017, 2017

2016
Ripple 2.0: Improved Movement of Cells in Routability-Driven Placement.
ACM Trans. Design Autom. Electr. Syst., 2016

2014
Analysis of the impact of spatial and temporal variations on the stability of SRAM arrays and the mitigation technique using independent-gate devices.
J. Parallel Distributed Comput., 2014

A low contact resistance graphene field effect transistor with single-layer-channel and multi-layer-contact.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2014

2013
A direct measurement scheme of amalgamated aging effects with novel on-chip sensor.
Proceedings of the 21st IEEE/IFIP International Conference on VLSI and System-on-Chip, 2013

Lifetime reliability assessment with aging information from low-level sensors.
Proceedings of the Great Lakes Symposium on VLSI 2013 (part of ECRC), 2013

2012
Variation tolerant on-chip degradation sensors for dynamic reliability management systems.
Microelectron. Reliab., 2012

Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices.
Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale Architectures, 2012

2011
A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits.
Proceedings of the 2011 IEEE/ACM International Symposium on Nanoscale Architectures, 2011


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