Study on Degradation Characteristics of IGBT under Repeated High Transient Electrical Stress. - Yaosheng Li; Xiaoliang Yang; Jinyuan Li; Zhongyuan Chen (EITCE, 2021)

On-Line Measurement of Chip Temperature Based on Blocking Leakage Current of the Insulated-Gate Bipolar Transistor Module in the High-Temperature Reverse-Bias Test. - Jinyuan Li; Yunong Liu; Yaosheng Li; Zhongyuan Chen; Chunsheng Guo; Hao Li (IEEE Access, 2021)

General, Efficient, and Real-Time Data Compaction Strategy for APT Forensic Analysis. - Tiantian Zhu; Jiayu Wang; Linqi Ruan; Chunlin Xiong; Jinkai Yu; Yaosheng Li; Yan Chen 004; Mingqi Lv; Tieming Chen (IEEE Trans. Inf. Forensics Secur., 2021)