Reconfigurable logic gate implemented by suspended-gate single-electron transistors. - Bingcai Sui; Liang Fang; Yaqing Chi (NEMS, 2010)

Analysis of negative differential conductance of single-island single-electron transistors owing to Coulomb oscillations. - Bingcai Sui; Liang Fang; Yaqing Chi; Chao Zhang (IET Circuits Devices Syst., 2010)

A Scan Chain Based SEU Test Method for Microprocessors. - Yaqing Chi; Yibai He; Bin Liang; Chunmei Hu (NCCET, 2013)

A low contact resistance graphene field effect transistor with single-layer-channel and multi-layer-contact. - Honghui Sun; Liang Fang; Yao Wang 002; Yaqing Chi; Rulin Liu (NANOARCH, 2014)

Research on single-event transient mechanism in a novel SOI CMOS technology. - Chao Zhang; Jianjun Chen; Yaqing Chi; Hui Yang (IEICE Electron. Express, 2014)

A Programmable Pre-emphasis Transmitter for SerDes in 40 nm CMOS. - Hongbing Tan; Haiyan Chen; Sheng Liu 001; Xikun Ma; Yaqing Chi (NCCET, 2017)

Comparison of single-event upset generated by heavy ion and pulsed laser. - Bin Liang; Ruiqiang Song; Jianwei Han; Yaqing Chi; Rui Chen; Chunmei Hu; Jianjun Chen; Yingqi Ma; Shipeng Shangguan (Sci. China Inf. Sci., 2017)

Modeling the impact of process and operation variations on the soft error rate of digital circuits. - Ruiqiang Song; Shuming Chen; Bin Liang; Yaqing Chi; Jianjun Chen (Sci. China Inf. Sci., 2017)

A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area. - Ruiqiang Song; Jinjin Shao; Bin Liang; Yaqing Chi; Jianjun Chen (ASICON, 2019)

28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery. - Hengzhou Yuan; Yang Guo 003; Jianjun Chen; Yaqing Chi; Xi Chen; Bin Liang (IEEE Access, 2019)

Characterization of P-hit and N-hit single-event transient using heavy ion microbeam. - Ruiqiang Song; Jinjin Shao; Bin Liang; Yaqing Chi; Jianjun Chen (IEICE Electron. Express, 2019)

Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs. - Jingyan Xu; Yang Guo 003; Ruiqiang Song; Bin Liang; Yaqing Chi (Symmetry, 2019)

Research on the influences of well structure on dose rate effects in 65nm CMOS circuit. - Qian Chen; Jianwei Han; Yingqi Ma; Sai Li; Jingtian Liu; Yaqing Chi; Bin Liang (IEICE Electron. Express, 2020)

MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology. - Ruiqiang Song; Jinjin Shao; Bin Liang; Yaqing Chi; Jianjun Chen (IEICE Electron. Express, 2020)

Investigation of Heavy-Ion Induced Single-Event Transient in 28 nm Bulk Inverter Chain. - Anquan Wu; Bin Liang; Yaqing Chi; Zhenyu Wu (Symmetry, 2020)

Current mirror with charge dissipation transistor for analogue single-event transient mitigation in space application. - Jingtian Liu; Bin Liang; Jianjun Chen; Yaqing Chi; Li Yan; Yang Guo 003 (IET Circuits Devices Syst., 2021)

Implementation of Radiation Hardened Flip-Flops Based on Novel Fishbone Layouts. - Chang Cai; Zehao Wu; Jing Zhang; Luchang Ding; Lei Shen; Jun Yu 010; Yaqing Chi (ISCAS, 2022)

A 0.024mm2 All-Digital Fractional Output Divider with 257fs Worst-Case Jitter Using Split-DTC-Based Background Calibration. - Yan Yu; Deng Luo; Jianjun Chen; Yang Guo 003; Bin Liang; Yaqing Chi; Hanhan Sun; Jing Xiao; Hao Gao; Ming Tao; Kai Tang (ISSCC, 2025)

Analysis of false lock in Mueller-Muller clock and data recovery system. - Yahao Fang; Deng Luo; Bin Liang; Jianjun Chen; Yaqing Chi; Hanhan Sun; Qian Sun; Jingtian Liu (Integr., 2025)