Design and Implementation of Wearable Dynamic Electrocardiograph Real-Time Monitoring Terminal. - Zhun Gong; Yaru Ding (IEEE Access, 2020)

Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection. - Wei Liu; Yaru Ding; Liang Zhao; Yi Zhao 015 (IRPS, 2021)

Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress. - Yaru Ding; Wei Liu; Yiming Qu; Liang Zhao; Yi Zhao 015 (IRPS, 2022)

Universal Hot Carrier Degradation Model under DC and AC Stresses. - Chu Yan; Yaru Ding; Yiming Qu; Liang Zhao; Yi Zhao 015 (IRPS, 2022)

The Design and Specification of Path Adjustable SFC Using YANG Data Model. - Yintan Ai; Hua Li; Xianrong Wang; Jiafeng Wang; Yaru Ding (ISCC, 2022)

Design and Implementation of SFC Monitoring and Alerting Based on YANG Data Model. - Yaru Ding; Yintan Ai; Xiaomin Zhang; Hua Li; Xianrong Wang; Hongwei Ruan (ISPA/BDCloud/SocialCom/SustainCom, 2022)

Interval time dependent wake-up effect of HfZrO ferroelectric capacitor. - Yaru Ding; Xinwei Yu; Chu Yan; Zeping Weng; Yiming Qu; Yi Zhao 015 (IRPS, 2023)

GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States. - Yiming Qu; Chu Yan; Xinwei Yu; Yaru Ding; Yi Zhao 015 (IRPS, 2023)

GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model. - Xinwei Yu; Chu Yan; Yaru Ding; Yiming Qu; Yi Zhao 015 (IRPS, 2023)

Development and Optimization of a Two-Degree-of-Freedom Piezoelectric Harvester Based on Parallel Cantilever Structure With Magnetic Coupling. - Yili Hu; Yaru Ding; Nan Wei; Xinhui Li; Jianping Li 003; Jijie Ma; Zhonghua Zhang; Guangming Cheng; Jianming Wen (IEEE Access, 2023)

Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs. - Yiming Qu; Chu Yan; Yaru Ding; Yi Zhao 015 (IRPS, 2024)

Orthorhombic-I Phase and Related Phase Transitions: Mechanism of Superior Endurance $(> 10^{14})$ of HfZrO Anti-ferroelectrics for DRAM Applications. - Zeping Weng; Zhangsheng Lan; Yaru Ding; Yiming Qu; Yi Zhao 015 (IRPS, 2024)

Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs. - Chu Yan; Yaru Ding; Yiming Qu; Yi Zhao 015 (IRPS, 2024)