A Continous-Parameter Markov Model and Detection Procedures for Intermittent Faults. - Stephen Y. H. Su; Israel Koren; Yashwant K. Malaiya (IEEE Trans. Computers, 1978)

A survey of methods for intermittent fault analysis. - Yashwant K. Malaiya; Stephen Y. H. Su (MARK, 1979)

State Diagram Approach for Functional Testing of Control Section. - Chi-Chang Liaw; Stephen Y. H. Su; Yashwant K. Malaiya (ITC, 1981)

Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. - Chi-Chang Liaw; Stephen Y. H. Su; Yashwant K. Malaiya (IEEE Trans. Computers, 1981)

Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults. - Yashwant K. Malaiya; Stephen Y. H. Su (IEEE Trans. Computers, 1981)

A New Fault Model and Testing Technique for CMOS Devices. - Yashwant K. Malaiya; Stephen Y. H. Su (ITC, 1982)

Testing for Timing Faults in Synchronous Sequential Integrated Circuits. - Yashwant K. Malaiya; Ramesh Narayanaswamy (ITC, 1983)

The Coverage Problem for Random Testing. - Yashwant K. Malaiya; Shoubao Yang (ITC, 1984)

Modeling and Testing for Timing Faults in Synchronous Sequential Circuits. - Yashwant K. Malaiya; Ramesh Narayanaswamy (IEEE Des. Test, 1984)

Faults in Microprogrammed and Hardwired Control. - Yashwant K. Malaiya (ITC, 1985)

On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. - Rochit Rajsuman; Yashwant K. Malaiya; Anura P. Jayasumana (DAC, 1987)

Design of a testable RISC-to-CISC control architecture. - Yashwant K. Malaiya; Sheng Feng (MICRO, 1988)

CMOS Stuck-open Fault Detection Using Single Test Patterns. - Rochit Rajsuman; Anura P. Jayasumana; Yashwant K. Malaiya (DAC, 1989)

On inherent untestability of unaugmented microprogrammed control. - Yashwant K. Malaiya (MICRO, 1989)

Limitations of switch level analysis for bridging faults. - Rochit Rajsuman; Yashwant K. Malaiya; Anura P. Jayasumana (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989)

CMOS stuck-open fault testability. - Rochit Rajsuman; Yashwant K. Malaiya; Anura P. Jayasumana (IEEE J. Solid State Circuits, 1989)

CMOS open-fault detection in the presence of glitches and timing skews. - Rochit Rajsuman; Anura P. Jayasumana; Yashwant K. Malaiya (IEEE J. Solid State Circuits, 1989)

Predictability measures for software reliability models. - Yashwant K. Malaiya; Nachimuthu Karunanithi; Pradeep Verma (COMPSAC, 1990)

On the testing of microprogrammed processor. - Suntae Hwang; Rochit Rajsuman; Yashwant K. Malaiya (MICRO, 1990)

An Introduction to Software Reliability Models. - Yashwant K. Malaiya; Pradip K. Srimani (Int. CMG Conference, 1991)

Gate level representation of ECL circuits for fault modeling. - Sankaran M. Menon; Anura P. Jayasumana; Yashwant K. Malaiya (Great Lakes Symposium on VLSI, 1991)

Prediction of software reliability using neural networks. - Nachimuthu Karunanithi; Yashwant K. Malaiya; L. Darrell Whitley (ISSRE, 1991)

Evaluation of detectability in BIST environment. - Sheng Feng; Yashwant K. Malaiya (VTS, 1991)

Enhancement of resolution in supply current based testing for large ICs. - Yashwant K. Malaiya; Anura P. Jayasumana; Qiao Tong; Sankaran M. Menon (VTS, 1991)

An analysis and testing of operation induced faults in MOS VLSI. - Rochit Rajsuman; Anura P. Jayasumana; Yashwant K. Malaiya; Juney Park (VTS, 1991)

Analysis of Detection Capability of Parallel Signature Analyzers. - Yinghua Min; Yashwant K. Malaiya; Boping Jin (IEEE Trans. Computers, 1991)

Design of CMOS circuits for stuck-open fault testability. - Anura P. Jayasumana; Yashwant K. Malaiya; Rochit Rajsuman (IEEE J. Solid State Circuits, 1991)

The scaling problem in neural networks for software reliability prediction. - Nachimuthu Karunanithi; Yashwant K. Malaiya (ISSRE, 1992)

The nature of fault exposure ratio. - Yashwant K. Malaiya; Anneliese von Mayrhauser; Pradip K. Srimani (ISSRE, 1992)

On Bridging Faults in ECL Circuits. - Sankaran M. Menon; Anura P. Jayasumana; Yashwant K. Malaiya (VLSI Design, 1992)

Behavior of faulty single BJT BiCMOS logic gates. - Sankaran M. Menon; Yashwant K. Malaiya; Anura P. Jayasumana (VTS, 1992)

Guest Editor's Introduction: VLSI Design 92. - Yashwant K. Malaiya (IEEE Des. Test Comput., 1992)

Using Neural Networks in Reliability Prediction. - Nachimuthu Karunanithi; L. Darrell Whitley; Yashwant K. Malaiya (IEEE Softw., 1992)

Steps to Practical Reliability Meassurement - Guest Editors' Introduction. - Pradip K. Srimani; Yashwant K. Malaiya (IEEE Softw., 1992)

Prediction of Software Reliability Using Connectionist Models. - Nachimuthu Karunanithi; L. Darrell Whitley; Yashwant K. Malaiya (IEEE Trans. Software Eng., 1992)

Test Generation for BiCMOS Circuits. - Sankaran M. Menon; Anura P. Jayasumana; Yashwant K. Malaiya (ISCAS, 1993)

Enhancing accuracy of software reliability prediction. - Michael Naixin Li; Yashwant K. Malaiya (ISSRE, 1993)

On the need for simulation for better characterization of software reliability. - Anneliese von Mayrhauser; Yashwant K. Malaiya; Pradip K. Srimani; James Keables (ISSRE, 1993)

The effect of correlated faults on software reliability. - Kang Wu; Yashwant K. Malaiya (ISSRE, 1993)

Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits. - W. K. Al-Assadi; Yashwant K. Malaiya; Anura P. Jayasumana (VLSI Design, 1993)

Testable design for BiCMOS stuck-open fault detection. - Sankaran M. Menon; Anura P. Jayasumana; Yashwant K. Malaiya (VTS, 1993)

An Examination of Fault Exposure Ratio. - Yashwant K. Malaiya; Anneliese von Mayrhauser; Pradip K. Srimani (IEEE Trans. Software Eng., 1993)

Faulty behavior of storage elements and its effects on sequential circuits. - W. K. Al-Assadi; Yashwant K. Malaiya; Anura P. Jayasumana (IEEE Trans. Very Large Scale Integr. Syst., 1993)

On input profile selection for software testing. - Michael Naixin Li; Yashwant K. Malaiya (ISSRE, 1994)

The relationship between test coverage and reliability. - Yashwant K. Malaiya; Michael Naixin Li; James M. Bieman; Rick Karcich; Bob Skibbe (ISSRE, 1994)

The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. - Sankaran M. Menon; Yashwant K. Malaiya; Anura P. Jayasumana; Carol Q. Tong (VLSI Design, 1994)

Input pattern classification for transistor level testing of BiCMOS circuits. - Sankaran M. Menon; Anura P. Jayasumana; Yashwant K. Malaiya (VTS, 1994)

Resolution Enhancement in IDDQ Testing for Large ICs. - Yashwant K. Malaiya; Anura P. Jayasumana; Carol Q. Tong; Sankaran M. Menon (VLSI Design, 1994)

A Novel High-Speed BiCMOS Domino Logic Family. - Anura P. Jayasumana; Yashwant K. Malaiya; Sankaran M. Menon (ISCAS, 1995)

ROBUST: a next generation software reliability engineering tool. - Michael Naixin Li; Yashwant K. Malaiya (ISSRE, 1995)

Antirandom testing: getting the most out of black-box testing. - Yashwant K. Malaiya (ISSRE, 1995)

Interconnection of FDDI-II networks through an ATM backbone - An analysis. - Ramanagopal V. Vogety; Yashwant K. Malaiya; Anura P. Jayasumana (LCN, 1995)

Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. - Sankaran M. Menon; Yashwant K. Malaiya; Anura P. Jayasumana; Rochit Rajsuman (IEEE J. Solid State Circuits, 1995)

Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. - Sankaran M. Menon; Anura P. Jayasumana; Yashwant K. Malaiya (Great Lakes Symposium on VLSI, 1996)

Fault exposure ratio estimation and applications. - Michael Naixin Li; Yashwant K. Malaiya (ISSRE, 1996)

Fault Modeling of ECL for High Fault Coverage of Physical Defects. - Sankaran M. Menon; Yashwant K. Malaiya; Anura P. Jayasumana (VLSI Design, 1996)

What do the software reliability growth model parameters represent? - Yashwant K. Malaiya; Jason Denton (ISSRE, 1997)

Automatic test generation using checkpoint encoding and antirandom testing. - Huifang Yin; Zemen Lebne-Dengel; Yashwant K. Malaiya (ISSRE, 1997)

Input Pattern Classification for Detection of Stuck-ON and Bridging Faults Using IDDQ Testing in BiCMOS and CMOS Circuits. - Sankaran M. Menon; Yashwant K. Malaiya; Anura P. Jayasumana (VLSI Design, 1997)

Operational and Test Performance in the Presence of Built-in Current Sensors. - Sankaran M. Menon; Yashwant K. Malaiya; Anura P. Jayasumana; Carol Q. Tong (VLSI Design, 1997)

Estimating the Number of Residual Defects. - Yashwant K. Malaiya; Jason Denton (HASE, 1998)

Antirandom vs. pseudorandom testing. - Shen Hui Wu; Yashwant K. Malaiya; Anura P. Jayasumana (ICCD, 1998)

Requirements volatility and defect density. - Yashwant K. Malaiya; Jason Denton (ISSRE, 1999)

Module Size Distribution and Defect Density. - Yashwant K. Malaiya; Jason Denton (ISSRE, 2000)

Software reliability growth with test coverage. - Yashwant K. Malaiya; Michael Naixin Li; James M. Bieman; Rick Karcich (IEEE Trans. Reliab., 2002)

Augmenting Test Case Generation Using Statechart. - Jiao Chen; Yashwant K. Malaiya (Software Engineering Research and Practice, 2004)

Dynamic power minimization during combinational circuit testing as a traveling salesman problem. - Artem Sokolov; Alodeep Sanyal; L. Darrell Whitley; Yashwant K. Malaiya (Congress on Evolutionary Computation, 2005)

Security Vulnerabilities in Software Systems: A Quantitative Perspective. - Omar Hussain Alhazmi; Yashwant K. Malaiya; Indrajit Ray (DBSec, 2005)

Modeling the Vulnerability Discovery Process. - Omar Hussain Alhazmi; Yashwant K. Malaiya (ISSRE, 2005)

Security vulnerability categories in major software systems. - Omar Hussain Alhazmi; Sung-Whan Woo; Yashwant K. Malaiya (Communication, Network, and Information Security, 2006)

Assessing Vulnerabilities in Apache and IIS HTTP Servers. - Sung-Whan Woo; Omar Hussain Alhazmi; Yashwant K. Malaiya (DASC, 2006)

Measuring and Enhancing Prediction Capabilities of Vulnerability Discovery Models for Apache and IIS HTTP Servers. - Omar Hussain Alhazmi; Yashwant K. Malaiya (ISSRE, 2006)

X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. - Ashutosh Sharma; Anura P. Jayasumana; Yashwant K. Malaiya (VTS, 2006)

Vulnerability Discovery in Multi-Version Software Systems. - Jinyoo Kim; Yashwant K. Malaiya; Indrakshi Ray (HASE, 2007)

Measuring, analyzing and predicting security vulnerabilities in software systems. - Omar Hussain Alhazmi; Yashwant K. Malaiya; Indrajit Ray (Comput. Secur., 2007)

Vulnerability Discovery Modeling Using Weibull Distribution. - HyunChul Joh; Jinyoo Kim; Yashwant K. Malaiya (ISSRE, 2008)

Seasonality in Vulnerability Discovery in Major Software Systems. - HyunChul Joh; Yashwant K. Malaiya (ISSRE, 2008)

Application of Vulnerability Discovery Models to Major Operating Systems. - Omar Hussain Alhazmi; Yashwant K. Malaiya (IEEE Trans. Reliab., 2008)

Antirandom Testing: A Distance-Based Approach. - Shen Hui Wu; Sridhar Jandhyala; Yashwant K. Malaiya; Anura P. Jayasumana (VLSI Design, 2008)

Seasonal Variation in the Vulnerability Discovery Process. - HyunChul Joh; Yashwant K. Malaiya (ICST, 2009)

An outlier detection based approach for PCB testing. - Xin He; Yashwant K. Malaiya; Anura P. Jayasumana; Kenneth P. Parker; Stephen Hird (ITC, 2009)

Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. - Xin He; Yashwant K. Malaiya; Anura P. Jayasumana; Kenneth P. Parker; Stephen Hird (ITC, 2010)

Modeling vulnerability discovery process in Apache and IIS HTTP servers. - Sung-Whan Woo; HyunChul Joh; Omar Hussain Alhazmi; Yashwant K. Malaiya (Comput. Secur., 2011)

Assessing Disaster Recovery Alternatives: On-Site, Colocation or Cloud. - Omar Hussain Alhazmi; Yashwant K. Malaiya (ISSRE Workshops, 2012)

Using Attack Surface Entry Points and Reachability Analysis to Assess the Risk of Software Vulnerability Exploitability. - Awad A. Younis; Yashwant K. Malaiya; Indrajit Ray (HASE, 2014)

Are the Classical Disaster Recovery Tiers Still Applicable Today? - Omar Hussain Alhazmi; Yashwant K. Malaiya (ISSRE Workshops, 2014)

Using Software Structure to Predict Vulnerability Exploitation Potential. - Awad A. Younis; Yashwant K. Malaiya (SERE (Companion), 2014)

Modeling Skewness in Vulnerability Discovery. - HyunChul Joh; Yashwant K. Malaiya (Qual. Reliab. Eng. Int., 2014)

Comparing and Evaluating CVSS Base Metrics and Microsoft Rating System. - Awad A. Younis; Yashwant K. Malaiya (QRS, 2015)

To Fear or Not to Fear That is the Question: Code Characteristics of a Vulnerable Functionwith an Existing Exploit. - Awad A. Younis; Yashwant K. Malaiya; Charles Anderson 001; Indrajit Ray (CODASPY, 2016)

Evaluating CVSS Base Score Using Vulnerability Rewards Programs. - Awad A. Younis; Yashwant K. Malaiya; Indrajit Ray (SEC, 2016)

Assessing vulnerability exploitability risk using software properties. - Awad A. Younis; Yashwant K. Malaiya; Indrajit Ray (Softw. Qual. J., 2016)

Periodicity in software vulnerability discovery, patching and exploitation. - HyunChul Joh; Yashwant K. Malaiya (Int. J. Inf. Sec., 2017)

An API Development Model for Digital Twins. - Jim A. Scheibmeir; Yashwant K. Malaiya (QRS Companion, 2019)

Quality Model for Testing Augmented Reality Applications. - Jim A. Scheibmeir; Yashwant K. Malaiya (UEMCON, 2019)

Adaptive Testing Based on Moment Estimation. - Peng Xiao 003; Yongfeng Yin; Bin Liu 032; Bo Jiang 001; Yashwant K. Malaiya (IEEE Trans. Syst. Man Cybern. Syst., 2020)

Social media analytics of the Internet of Things. - Jim A. Scheibmeir; Yashwant K. Malaiya (Discov. Internet Things, 2021)

Comparison of Agile Scaling Frameworks. - Robin J. Yeman; Yashwant K. Malaiya (ICISS, 2023)