Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation. - Yassine Belmehdi; Stephane Azzopardi; A. Benmansour; Jean-Yves Delétage; Eric Woirgard (Microelectron. Reliab., 2009)

Experimental electro-mechanical static characterization of IGBT bare die under controlled temperature. - Yassine Belmehdi; Stephane Azzopardi; Jean-Yves Delétage; Eric Woirgard (Microelectron. Reliab., 2010)