A 3D IC BIST for pre-bond test of TSVs using ring oscillators. - Yassine Fkih; Pascal Vivet; Bruno Rouzeyre; Marie-Lise Flottes; Giorgio Di Natale (NEWCAS, 2013)

2D to 3D Test Pattern Retargeting Using IEEE P1687 Based 3D DFT Architectures. - Yassine Fkih; Pascal Vivet; Bruno Rouzeyre; Marie-Lise Flottes; Giorgio Di Natale; Juergen Schloeffel (ISVLSI, 2014)

3D DFT Challenges and Solutions. - Yassine Fkih; Pascal Vivet; Marie-Lise Flottes; Bruno Rouzeyre; Giorgio Di Natale; Juergen Schloeffel (ISVLSI, 2015)